Material 版 (精华区)
发信人: boyang (Protoss), 信区: Material
标 题: Nature:关于Si3N4
发信站: 哈工大紫丁香 (Tue Apr 20 09:57:18 2004), 站内信件
Observation of rare-earth segregation in silicon nitride ceramics at subnanome
tre dimensions
Silicon nitride (Si3N4) ceramics are used in numerous applications because of
their superior mechanical properties. Their intrinsically brittle nature is a
critical issue, but can be overcome by introducing whisker-like microstructura
l features. However, the formation of such anisotropic grains is very sensitiv
e to the type of cations used as the sintering additives. Understanding the or
igin of dopant effects, central to the design of high-performance Si3N4 cerami
cs, has been sought for many years. Here we show direct images of dopant atoms
(La) within the nanometre-scale intergranular amorphous films typically found
at grain boundaries, using aberration corrected Z-contrast scanning transmiss
ion electron microscopy. It is clearly shown that the La atoms preferentially
segregate to the amorphous/crystal interfaces. First-principles calculations c
onfirm the strong preference of La for the crystalline surfaces, which is esse
ntial for forming elongated grains and a toughened microstructure. Whereas principles of micrometre-scale structural design are currently use
d to improve the mechanical properties of ceramics, this work represents a ste
p towards the atomic-level structural engineering required for the next genera
tion of ceramics.
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